00000cmm a22000004a 4500 UP-99796217611211934 Buklod 20140423132640.0 m go j cr cn |||aaaaa 110824s2011 xxu u | eng d 9781441993779 (eBook) 1441993770 (eBook) (iLib)UPD-00214608073 DML eng DMLUC TK 7871.99 M44 B48 2011eb Bhushan, Manjul. Microelectronic test structures for CMOS technology [electronic resource] Manjul Bhushan, Mark B. Ketchen. New York Springer c2011. 1 online resource (xxxiv, 373 p.) Introduction -- Test Structure Basics -- Resistors -- Capacitors -- MOSFETs -- Ring Oscillators -- High Speed Characterization -- Test Structures of SOI Technology -- Test Equipment and Measurements -- Data Analysis. IP-based subscription, access limited to within on-campus computer network. Access via Electronic Resources of the UPD University Library Website. Microelectronic Test Structures for CMOS Technology and Products addresses the basic concepts of the design of test structures for incorporation within test-vehicles, scribe-lines, and CMOS products. The role of test structures in the development and monitoring of CMOS technologies and products has become ever more important with the increased cost and complexity of development and manufacturing. In this timely volume, IBM scientists Manjul Bhushan and Mark Ketchen emphasize high speed characterization techniques for digital CMOS circuit applications and bridging between circuit performance and characteristics of MOSFETs and other circuit elements.  Detailed examples are presented throughout, many of which are equally applicable to other microelectronic technologies as well. The authors? overarching goal is to provide students and technology practitioners alike a practical guide to the disciplined design and use of test structures that give unambiguous information on the parametrics and performance of digital CMOS technology. Electronic reproduction. New York SpringerLink 2011. Available via World Wide Web through SpringerLink. Metal oxide semiconductors, Complementary Testing. Electronic books. Ketchen, Mark B. SpringerLink (Online service). Available for University of the Philippines Diliman via SpringerLink. Click here to access http://link.springer.com/book/10.1007/978-1-4419-9377-9 FO Monograph UPD DMLR Electronic Resource