Accelerated life testing of the metal film capacitors and life study of single phase electronic watthour meters.
Abstract (Accelerated life testing (ALT) was used to determine the life distribution of metal film capacitors with stress voltage as accelerating factor. At levels 460V, 690V and 920V, the 4:2:1 sample size allocation scheme was considered in the capacitors to the stress level. Distribution fitting...
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| Aineistotyyppi: | Opinnäyte |
| Kieli: | English |
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Quezon City
University of the Philippines
c2014.
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| Aiheet: |