Scanning probe microscopy of functional materials nanoscale imaging and spectroscopy

Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging app...

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Dades bibliogràfiques
Autor corporatiu: SpringerLink (Online service)
Altres autors: Kalinin, Sergei V.
Format: Electronic Resource
Idioma:English
Publicat: New York Springer c2010.
Matèries:
Accés en línia:Available for University of the Philippines Diliman via SpringerLink. Click here to access