<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.loc.gov/MARC21/slim http://www.loc.gov/standards/marcxml/schema/MARC21slim.xsd" xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>00000cmm a22000004i 4500</leader>
  <controlfield tag="001">UP-99796217611095163</controlfield>
  <controlfield tag="003">Buklod</controlfield>
  <controlfield tag="005">20140201093207.0</controlfield>
  <controlfield tag="006">m    go  j        </controlfield>
  <controlfield tag="007">cr |n |||auu|a</controlfield>
  <controlfield tag="008">110330s2011    xx         u |      eng d</controlfield>
  <datafield tag="020" ind1=" " ind2=" ">
   <subfield code="a">9783642120121 (eBook)</subfield>
  </datafield>
  <datafield tag="020" ind1=" " ind2=" ">
   <subfield code="a">3642120121 (eBook)</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(iLib)UPD-00212404594</subfield>
  </datafield>
  <datafield tag="040" ind1=" " ind2=" ">
   <subfield code="a">DML</subfield>
  </datafield>
  <datafield tag="041" ind1="0" ind2=" ">
   <subfield code="a">eng</subfield>
  </datafield>
  <datafield tag="042" ind1=" " ind2=" ">
   <subfield code="a">DMLUC</subfield>
  </datafield>
  <datafield tag="084" ind1=" " ind2=" ">
   <subfield code="a">TA 418.7</subfield>
   <subfield code="b">O68 2011eb</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Optical measurement of surface topography</subfield>
   <subfield code="h">[electronic resource]</subfield>
   <subfield code="c">Richard Leach (Ed.).</subfield>
  </datafield>
  <datafield tag="264" ind1=" " ind2="1">
   <subfield code="a">Berlin</subfield>
   <subfield code="a">New York</subfield>
   <subfield code="b">Springer</subfield>
   <subfield code="c">c2011.</subfield>
  </datafield>
  <datafield tag="300" ind1=" " ind2=" ">
   <subfield code="a">1 online resource (xiii, 323 p.)</subfield>
   <subfield code="b">ill.</subfield>
  </datafield>
  <datafield tag="505" ind1="0" ind2=" ">
   <subfield code="a">Introduction to surface texture measurement -- Some common terms and definitions -- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy -- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.-  Coherence scanning interferometry -- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods.</subfield>
  </datafield>
  <datafield tag="506" ind1=" " ind2=" ">
   <subfield code="a">IP-based subscription, access limited to within on-campus computer network.</subfield>
   <subfield code="c">Access via Electronic Resources of the UPD University Library Website.</subfield>
  </datafield>
  <datafield tag="520" ind1=" " ind2=" ">
   <subfield code="a">easurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.</subfield>
  </datafield>
  <datafield tag="533" ind1=" " ind2=" ">
   <subfield code="a">Electronic reproduction.</subfield>
   <subfield code="b">New York</subfield>
   <subfield code="c">SpringerLink</subfield>
   <subfield code="d">2011.</subfield>
   <subfield code="n">Available via World Wide Web through SpringerLink.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
   <subfield code="a">Surfaces (Technology)</subfield>
   <subfield code="x">Optical properties.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
   <subfield code="a">Surfaces (Technology)</subfield>
   <subfield code="x">Testing.</subfield>
  </datafield>
  <datafield tag="650" ind1=" " ind2="0">
   <subfield code="a">Electronic books.</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Leach, Richard.</subfield>
  </datafield>
  <datafield tag="710" ind1="2" ind2=" ">
   <subfield code="a">SpringerLink (Online service).</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="z">Available for University of the Philippines Diliman via SpringerLink. Click here to access</subfield>
   <subfield code="u">http://dx.doi.org/10.1007/978-3-642-12012-1</subfield>
  </datafield>
  <datafield tag="856" ind1=" " ind2=" ">
   <subfield code="z">(viewed 05 June 2014)</subfield>
  </datafield>
  <datafield tag="905" ind1=" " ind2=" ">
   <subfield code="a">FO</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="a">Monograph</subfield>
  </datafield>
  <datafield tag="852" ind1="0" ind2=" ">
   <subfield code="a">UPD</subfield>
   <subfield code="b">DMLR</subfield>
  </datafield>
  <datafield tag="942" ind1=" " ind2=" ">
   <subfield code="a">Electronic Resource</subfield>
  </datafield>
 </record>
</collection>
