Strain-engineered MOSFETs - Maiti, C. K.; Maiti, T. K. (Boca Raton, Fla. CRC Press, 2013)
1. Introduction -- 2. Substrate-induced strain engineering in CMOS technology -- 3. Process-induced stress engineering in CMOS technology -- 4. Electronic properties of strain-engineered semiconductors -- 5. Strain-engineered MOSFETs -- 6. Noise in strain-engineered devices / C. Mukherjee -- 7. Technology CAD of strain-engineered MOSFETs -- 8. Reliability and degradation of strain-engineered MOSFETs -- 9. Process compact modelling of strain-engineered MOSFETs -- 10. Process-aware design of strain-engineered MOSFETs -- 11. Conclusions.
Keywords: Metal oxide semiconductor field-effect transistors -- Reliability; Integrated circuits -- Fault tolerance; Strains and stresses; Electronic books