Reliability of RoHS-Compliant 2D and 3D IC interconnects
| Κύριος συγγραφέας: | |
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| Μορφή: | Electronic Resource |
| Γλώσσα: | English |
| Έκδοση: |
New York, N.Y.
McGraw-Hill
c2011.
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| Έκδοση: | First edition. |
| Θέματα: | |
| Διαθέσιμο Online: | Available for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access Also available remotely for University of the Philippines Diliman via McGraw-Hill Access Engineering. Click here to access thru EZproxy |