Lau, J. H. (2011). Reliability of RoHS-Compliant 2D and 3D IC interconnects (First edition.). McGraw-Hill.
Čikaški stil citiranja (17. izdanje)Lau, John H. Reliability of RoHS-Compliant 2D and 3D IC Interconnects. First edition. New York, N.Y: McGraw-Hill, 2011.
MLA način citiranja (9. izdanje)Lau, John H. Reliability of RoHS-Compliant 2D and 3D IC Interconnects. First edition. McGraw-Hill, 2011.
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