A bayesian approach to the analysis of split-plot combined and product arrays and optimization in robust parameter design.
Many robust parameter design (RPD) studies involve a split-plot randomization structure and it is essential to account for the induced correlation structure to obtain valid inferences in the analysis. Bayesian methods are appealing for these studies because they naturally accommodate a general class...
| הוצא לאור ב: | Journal of Quality Technology 44, 4 (2012). |
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| מחבר ראשי: | |
| פורמט: | Article |
| שפה: | English |
| נושאים: |