Test slice difference technique for low-transition test data compression.
This paper presents a low power strategy for test data compression and a new decompression scheme for test vectors. In our method, we propose an efficient algorithm for scan chain reordering to deal with the power dissipation problem. Further, we also propose a test slice difference (TSD) technique...
| 發表在: | Journal of Applied Science and Engineering 15, 2 (2012). |
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| 主要作者: | |
| 格式: | Article |
| 語言: | English |
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