APA aipamena

Danila, O., Steiner, S. H., & Mackay, R. J. Assessing a binary measurement system with varying misclassification rates using a latent class random effects model. Journal of Quality Technology.

Chicago Style aipamena

Danila, Oana, Stefan H. Steiner, and R. Jock Mackay. "Assessing a Binary Measurement System with Varying Misclassification Rates Using a Latent Class Random Effects Model." Journal of Quality Technology .

MLA aipamena

Danila, Oana, et al. "Assessing a Binary Measurement System with Varying Misclassification Rates Using a Latent Class Random Effects Model." Journal of Quality Technology, .