Analysis of defect structures in silicon solar cell materials.
Three (3) solar cells fabricated from EFG ribbons were subjected to quantitative defect analysis on several surface planes. The internal planes were observed by removing surface layers of silicon atoms by chemical dissolution. The results show that the average dislocation pit density varies from one...
| 發表在: | Philippine Engineering Journal 6, 1 (1985). |
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| 主要作者: | |
| 格式: | Article |
| 語言: | English |