De Mast, J. Measurement system analysis for binary inspection: Continuous versus dichotomous measurands. Journal of Quality Technology.
Chicago Style (17th ed.) CitationDe Mast, Jeroen. "Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands." Journal of Quality Technology .
MLA (9th ed.) CitationDe Mast, Jeroen. "Measurement System Analysis for Binary Inspection: Continuous Versus Dichotomous Measurands." Journal of Quality Technology, .
Warning: These citations may not always be 100% accurate.