Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
芝加哥风格引文Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
MLA引文Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
警告：这些引文格式不一定是100％准确.