Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Citação norma ChicagoShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
Citação norma MLAShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.