Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Chicago (17e ed.) BronvermeldingShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
MLA (9e ed.) BronvermeldingShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Let op: Deze citaties zijn niet altijd 100% accuraat.