Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Chicagoスタイル(17版)引用形式Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
MLA(9版)引用形式Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
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