Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Citazione stile Chigago Style (17a edizione)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
Citatione MLA (9a ed.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.