Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Chicago Style (17th ed.) CitationShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
ציטוט MLAShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.