Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Style de citation Chicago (17e éd.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
Style de citation MLA (9e éd.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Attention : ces citations peuvent ne pas être correctes à 100%.