Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Chicago Style aipamenaShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
MLA aipamenaShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Kontuz: berrikusi erreferentzia hauek erabili aurretik.