Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Cita Chicago Style (17a ed.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
Cita MLA (9a ed.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Precaución: Estas citas no son 100% exactas.