Cita APA (7a ed.)

Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.

Cita Chicago Style (17a ed.)

Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .

Cita MLA (9a ed.)

Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .

Precaución: Estas citas no son 100% exactas.