Cita APA (7th ed.)

Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.

Cita Chicago (17th ed.)

Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .

Cita MLA (9th ed.)

Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .

Atenció: Aquestes cites poden no estar 100% correctes.