Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Cita Chicago (17th ed.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
Cita MLA (9th ed.)Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Atenció: Aquestes cites poden no estar 100% correctes.