Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.
Chicago Style (17th ed.) CitationShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .
MLA (9th ed.) CitationShang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .
Warning: These citations may not always be 100% accurate.