APA (7. basım) Alıntı

Shang, Y. Profile monitoring with binary data and random predictors. Journal of Quality Technology.

Chicago Style (17. basım) Atıf

Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology .

MLA (9th ed.) Atıf

Shang, Yanfen. "Profile Monitoring with Binary Data and Random Predictors." Journal of Quality Technology, .

Uyarı: Bu alıntı herzaman %100 doğru olmayabilir..