Simultaneous switching noise analysis using application specific device modeling.
In this paper, we introduce an application-specific device modeling methodology to develop simple device model that accurately tracks the actual device I-V characteristics in relevant but bounded operating regions. We have specifically used a simple MOSFET model to precisely analyze the switching no...
| Publicado en: | IEEE Transactions on VLSI systems 11, 6 (2003). |
|---|---|
| Autor principal: | |
| Formato: | Artículo |
| Lenguaje: | English |
| Materias: |