Simultaneous switching noise analysis using application specific device modeling.
In this paper, we introduce an application-specific device modeling methodology to develop simple device model that accurately tracks the actual device I-V characteristics in relevant but bounded operating regions. We have specifically used a simple MOSFET model to precisely analyze the switching no...
| Published in: | IEEE Transactions on VLSI systems 11, 6 (2003). |
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| Main Author: | |
| Format: | Article |
| Language: | English |
| Subjects: |