A jitter characterization system using a component-invariant Vernier delay line.

Jitter characterization has become significantly more important for systems running at multigigahertz data rates. Time and frequency domain characterization of jitter is thus a crucial element for system specification testing. Time domain jitter measurement on a data signal with subgate timing resol...

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Pubblicato in:	IEEE Transactions on VLSI systems 12, 1 (2004).
Autore principale:	Chan, A.H
Natura:	Articolo
Lingua:	English
Soggetti:	0.18 micron. 19 ps. CMOS process. D-latches. IC design. RTL. Si. VDL. Complementary metal-oxide-semiconductor process. Component invariant Vernier delay line. Data signal. Delay chains. Delay elements. Field programmable gate array. Frequency domain characterization. Integrated circuit. Jitter characterization system. Measurement device. Multigigahertz data rates. Production test. Register transfer level description. Silicon. Subgate timing resolution. System specification testing. Time domain characterization. Time domain jitter measurement. Timing resolution.