Chan, A. A jitter characterization system using a component-invariant Vernier delay line. IEEE Transactions on VLSI systems.
Chicago Style (17. basım) AtıfChan, A.H. "A Jitter Characterization System Using a Component-invariant Vernier Delay Line." IEEE Transactions on VLSI Systems .
MLA (9th ed.) AtıfChan, A.H. "A Jitter Characterization System Using a Component-invariant Vernier Delay Line." IEEE Transactions on VLSI Systems, .
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