A new maximal diagnosis algorithm for interconnect test.

A new maximal diagnosis algorithm for interconnect test.

Interconnect test for highly integrated environments becomes more important in terms of its test time and a complete diagnosis, as the complexity of the circuit increases. Since the board-level interconnect test is based on boundary scan technology, it takes a long test time to apply test vectors se...

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Bibliografische gegevens
Gepubliceerd in:IEEE Transactions on VLSI systems 12, 5 (2004).
Hoofdauteur: Yongjoon Kim
Formaat: Artikel
Taal:English
Onderwerpen:
Board-level test.
Boundary scan technology.
Circuit complexity.
Diagnosis algorithm.
Fault diagnosis.
Interconnect test.