Yongjoon Kim. A new maximal diagnosis algorithm for interconnect test. IEEE Transactions on VLSI systems.
Citazione stile Chigago Style (17a edizione)Yongjoon Kim. "A New Maximal Diagnosis Algorithm for Interconnect Test." IEEE Transactions on VLSI Systems .
Citatione MLA (9a ed.)Yongjoon Kim. "A New Maximal Diagnosis Algorithm for Interconnect Test." IEEE Transactions on VLSI Systems, .
Attenzione: Queste citazioni potrebbero non essere precise al 100%.