APA citiranje

Yongjoon Kim. A new maximal diagnosis algorithm for interconnect test. IEEE Transactions on VLSI systems.

Chicago Style (17th ed.) Citation

Yongjoon Kim. "A New Maximal Diagnosis Algorithm for Interconnect Test." IEEE Transactions on VLSI Systems .

MLA citiranje

Yongjoon Kim. "A New Maximal Diagnosis Algorithm for Interconnect Test." IEEE Transactions on VLSI Systems, .