APA (7th ed.) Citation

Yongjoon Kim. A new maximal diagnosis algorithm for interconnect test. IEEE Transactions on VLSI systems.

Chicago Style (17th ed.) Citation

Yongjoon Kim. "A New Maximal Diagnosis Algorithm for Interconnect Test." IEEE Transactions on VLSI Systems .

MLA (9th ed.) Citation

Yongjoon Kim. "A New Maximal Diagnosis Algorithm for Interconnect Test." IEEE Transactions on VLSI Systems, .

Warning: These citations may not always be 100% accurate.