Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.

Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of te...

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Xuất bản năm:	IEEE Transactions on VLSI systems 12, 7 (2004).
Tác giả chính:	Pomeranz, I.
Định dạng:	Bài viết
Ngôn ngữ:	English
Những chủ đề:	VLSI circuits. Functional test sequences. Scan based stuck tests. Scan operation. Stuck-at fault coverage. Very large scale integrated circuits.