Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.
Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of te...
| প্রকাশিত: | IEEE Transactions on VLSI systems 12, 7 (2004). |
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| প্রধান লেখক: | |
| বিন্যাস: | প্রবন্ধ |
| ভাষা: | English |
| বিষয়গুলি: |