Pomeranz, I. Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. IEEE Transactions on VLSI systems.
Chicago-Zitierstil (17. Ausg.)Pomeranz, I. "Improving the Stuck-at Fault Coverage of Functional Test Sequences by Using Limited-scan Operations." IEEE Transactions on VLSI Systems .
MLA-Zitierstil (9. Ausg.)Pomeranz, I. "Improving the Stuck-at Fault Coverage of Functional Test Sequences by Using Limited-scan Operations." IEEE Transactions on VLSI Systems, .
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.