Cita APA (7a ed.)

Pomeranz, I. Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. IEEE Transactions on VLSI systems.

Cita Chicago Style (17a ed.)

Pomeranz, I. "Improving the Stuck-at Fault Coverage of Functional Test Sequences by Using Limited-scan Operations." IEEE Transactions on VLSI Systems .

Cita MLA (9a ed.)

Pomeranz, I. "Improving the Stuck-at Fault Coverage of Functional Test Sequences by Using Limited-scan Operations." IEEE Transactions on VLSI Systems, .