Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for automatic design of concurrent failure detection circuitry for linear analog systems is discussed in this paper. The desired hardware bound...
| Argitaratua izan da: | IEEE Transactions on VLSI systems 12, 7 (2004). |
|---|---|
| Egile nagusia: | |
| Formatua: | Artikulua |
| Hizkuntza: | English |
| Gaiak: |