Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.

Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for automatic design of concurrent failure detection circuitry for linear analog systems is discussed in this paper. The desired hardware bound...

Полное описание

Библиографические подробности
Опубликовано в::IEEE Transactions on VLSI systems 12, 7 (2004).
Главный автор: Ozev, S.
Формат: Статья
Язык:English
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