Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for automatic design of concurrent failure detection circuitry for linear analog systems is discussed in this paper. The desired hardware bound...
| 出版年: | IEEE Transactions on VLSI systems 12, 7 (2004). |
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| 第一著者: | |
| フォーマット: | 論文 |
| 言語: | English |
| 主題: |