Design of concurrent test Hardware for Linear analog circuits with constrained hardware overhead.

Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for automatic design of concurrent failure detection circuitry for linear analog systems is discussed in this paper. The desired hardware bound...

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Detalles Bibliográficos
Publicado en:IEEE Transactions on VLSI systems 12, 7 (2004).
Autor Principal: Ozev, S.
Formato: Artigo
Idioma:English
Subjects: