Yi Zhao. Double sampling data checking technique: An online testing solution for multisource noise-induced errors on on-chip interconnects and buses. IEEE Transactions on VLSI systems.
芝加哥风格引文Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems .
MLA引文Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems, .
警告：这些引文格式不一定是100％准确.