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Lua i Stíl Chicago (17ú heag.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems .
Lua MLA (9ú heag.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems, .
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