Yi Zhao. Double sampling data checking technique: An online testing solution for multisource noise-induced errors on on-chip interconnects and buses. IEEE Transactions on VLSI systems.
Cita Chicago Style (17a ed.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems .
Cita MLA (9a ed.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems, .
Precaución: Estas citas no son 100% exactas.