Yi Zhao. Double sampling data checking technique: An online testing solution for multisource noise-induced errors on on-chip interconnects and buses. IEEE Transactions on VLSI systems.
Chicago-Zitierstil (17. Ausg.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems .
MLA-Zitierstil (9. Ausg.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems, .
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.