Yi Zhao. Double sampling data checking technique: An online testing solution for multisource noise-induced errors on on-chip interconnects and buses. IEEE Transactions on VLSI systems.
Citace podle Chicago (17th ed.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems .
Citace podle MLA (9th ed.)Yi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems, .
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