Yi Zhao. Double sampling data checking technique: An online testing solution for multisource noise-induced errors on on-chip interconnects and buses. IEEE Transactions on VLSI systems.
Chicago Style (17th ed.) CitationYi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems .
MLA (9th ed.) CitationYi Zhao. "Double Sampling Data Checking Technique: An Online Testing Solution for Multisource Noise-induced Errors on On-chip Interconnects and Buses." IEEE Transactions on VLSI Systems, .
Warning: These citations may not always be 100% accurate.