Reverse-body bias and supply collapse for low effective standby power.

Integrated circuits fabricated on a low-leakage process typically display lower performance due to the high threshold voltage (Vt) transistors. Higher performance microprocessors sacrifice power efficiency by decreasing Vt. We show that a processor built on a low Vt process can achieve the power-per...

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發表在:IEEE Transactions on VLSI systems 12, 9 (2004).
主要作者: Clark, L.T
格式: Article
語言:English
主題: