00000cab a22000003a 4500 UP-99796217609611811 Buklod 20231007234427.0 m |o d | ta 110114s xx d | ||r ||||| || DENGII eng Esch, G., Jr. Near-linear CMOS I O driver with less sensitivity to process, voltage, and temperature variations. pp. 1253-1257 Matching input/output (I/O) driver output resistance to transmission line impedance is critical for high-speed I/O operation in source series termination environments. Tuning driver output resistance can be accomplished through the use of calibration circuitry. Under ideal conditions, calibration circuitry can properly calibrate an I/O driver. Operating in an environment with die process, voltage, and temperature variations, that same calibration circuitry may perform improperly. This brief presents an I/O driver design that is less sensitive to process, voltage, and temperature variations. The proposed driver design provides a near linear or flat, output resistance response verses output voltage. Advantages of the proposed I/O driver architecture lie in applications where the output DC operating point may have a large variation, thus, reducing the error in matching output resistance. DC operating point. I/O driver architecture. Calibration circuitry. High speed I/O operation. Input-output driver output resistance. Linear CMOS I/O driver. Output resistance response. Output voltage variations. Source series termination environments. Temperature variations. Transmission line impedance. Tuning driver output resistance. IEEE Transactions on VLSI systems 12, 11 (2004). FO Article