Gonciari, P. Synchronization overhead in SOC compressed test. IEEE Transactions on VLSI systems.
Cita Chicago (17th ed.)Gonciari, P.T. "Synchronization Overhead in SOC Compressed Test." IEEE Transactions on VLSI Systems .
Cita MLA (9th ed.)Gonciari, P.T. "Synchronization Overhead in SOC Compressed Test." IEEE Transactions on VLSI Systems, .
Atenció: Aquestes cites poden no estar 100% correctes.