Design of wireless on-wafer submicron characterization system.

A wireless technique for the testing of very large scale ICs and wafers is presented. This test technique uses standard CMOS to achieve wireless parametric testing. This technique has virtually no area overhead, minimal power requirements, and no process or design changes are required. Most compelli...

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Bibliographic Details
Published in:	IEEE Transactions on VLSI systems 13, 2 (2005).
Main Author:	Moore, B.
Format:	Article
Language:	English
Subjects:	CMOS circuit. Pentium-class VLSI circuit. VLSI antenna designs. VLSI chip manufacture. VLSI wafer manufacture. Antenna coupling. Communications link. Contactless testing. In-line process control. In-line process monitoring. Minimal power requirements. Packaging. Specific circuit simulations. Submilliwatt power levels. Very large scale integrated circuit testing. Very large scale integrated wafer testing. Wireless method. Wireless on-wafer submicron system. Wireless parametric testing.