Olivieri, M. A novel yield optimization technique for digital CMOS circuits design by means of process parameters run-time estimation and body bias active control. IEEE Transactions on VLSI systems.
Chicagoスタイル(17版)引用形式Olivieri, M. "A Novel Yield Optimization Technique for Digital CMOS Circuits Design by Means of Process Parameters Run-time Estimation and Body Bias Active Control." IEEE Transactions on VLSI Systems .
MLA(9版)引用形式Olivieri, M. "A Novel Yield Optimization Technique for Digital CMOS Circuits Design by Means of Process Parameters Run-time Estimation and Body Bias Active Control." IEEE Transactions on VLSI Systems, .
警告: この引用は必ずしも正確ではありません.