Jin-Fu Li. A built-in self-repair design for RAMs with 2-D redundancy. IEEE Transactions on VLSI systems.
Chicago (17e ed.) BronvermeldingJin-Fu Li. "A Built-in Self-repair Design for RAMs with 2-D Redundancy." IEEE Transactions on VLSI Systems .
MLA (9e ed.) BronvermeldingJin-Fu Li. "A Built-in Self-repair Design for RAMs with 2-D Redundancy." IEEE Transactions on VLSI Systems, .
Let op: Deze citaties zijn niet altijd 100% accuraat.