Cita APA (7th ed.)

Shyue-Kung Lu. Design-for-testability and fault-tolerant techniques for FFT processors. IEEE Transactions on VLSI systems.

Cita Chicago (17th ed.)

Shyue-Kung Lu. "Design-for-testability and Fault-tolerant Techniques for FFT Processors." IEEE Transactions on VLSI Systems .

Cita MLA (9th ed.)

Shyue-Kung Lu. "Design-for-testability and Fault-tolerant Techniques for FFT Processors." IEEE Transactions on VLSI Systems, .