APA (7th ed.) Citation

Shyue-Kung Lu. Design-for-testability and fault-tolerant techniques for FFT processors. IEEE Transactions on VLSI systems.

Chicago Style (17th ed.) Citation

Shyue-Kung Lu. "Design-for-testability and Fault-tolerant Techniques for FFT Processors." IEEE Transactions on VLSI Systems .

MLA (9th ed.) Citation

Shyue-Kung Lu. "Design-for-testability and Fault-tolerant Techniques for FFT Processors." IEEE Transactions on VLSI Systems, .

Warning: These citations may not always be 100% accurate.