Nine-coded compression technique for testing embedded cores in SoCs.

Nine-coded compression technique for testing embedded cores in SoCs.

This paper presents a new test-data compression technique that uses exactly nine codewords. Our technique aims at precomputed data of intellectual property cores in system-on-chips and does not require any structural information of cores. The technique is flexible in utilizing both fixed- and variab...

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Bibliografische gegevens
Gepubliceerd in:IEEE Transactions on VLSI systems 13, 6 (2005).
Hoofdauteur: Tehranipoor, M.
Formaat: Artikel
Taal:English
Onderwerpen:
Huffman codes.
Capacitor switching.
Decompression logic.
Digital system testing.
Embedded cores testing.
Fixed-length blocks.
Integrated circuit testing.
Intellectual property cores.
Multiple-scan chain design.
Nine-coded compression.
Power demand.
Run length codes.
Single-scan chain design.
Structural core information.
System-on-chip.
Test-application time.
Test-data compression.
Test-data volume.
Variable-length blocks.