Diagnosis of single stuck-at faults and multiple timing faults in scan chains.

Diagnosis of single stuck-at faults and multiple timing faults in scan chains.

A diagnosis technique to locate single stuck-at faults and multiple timing faults in scan chains is presented. This technique applies single excitation (SE) patterns, in which only one bit is flipped in the presence of multiple faults. With SE patterns, the problem of unknown values in scan chains i...

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Bibliografische gegevens
Gepubliceerd in:IEEE Transactions on VLSI systems 13, 6 (2005).
Hoofdauteur: Chien-Mo Li, J.
Formaat: Artikel
Taal:English
Onderwerpen:
Automatic test pattern generators.
Benchmark circuits.
Fault diagnosis.
Multiple excitation patterns.
Multiple timing faults.
Scan chains.
Stuck-at faults.